digital microscope0 pages

www.axsys.com Axsys Technologies dual eld of view, fully automated, single objective Microscope can be adapted to a variety of wafer and solar cell inspection technologies. The design features integrated illumination, dual cameras, active position feedback, and an integrated controller. High bandwidths can be achieved resulting in an overall increase in through put at the system level. The dual eld of view cameras provide dedicated wide and narrow elds of view, allowing for quick target acquisition and high resolution target examination.

System Specications

Parcentricity 10 micronIlumination Wavelength 500 nmParfocality 20 micronOperational Bandwidth >200 HzOptical Resolution (FOV1)* 1.6 micronPosition Output Analog Z-Axis Actuator Range 3 mmCleanroom Compatible Customer SpecifiedVertical Precision* 2 micronElectronitcs Interface Customer SpecifiedAutofocus Capture Range* 1000 micronWeight 5.6 kg (12.5 lbs)Laser Detector Wavelength 785 nmOverall Dimensions 15Ҕ X 9 X 4.5Ԕ >

2909 Waterview Dr, Rochester Hills, MI 48309248.293.2900 | www.axsys.com

Manufacturer reserves the right to change specifications to reflect latest changes in technology and improvements at any time without notice. Export is subject to US Government regulations. size="-1">